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SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

申请公布号:US2009194813(A1)

申请号:US20090360645

申请日期:2009.01.27

申请公布日期:2009.08.06

申请人:
ELPIDA MEMORY, INC.

发明人:FUJIMOTO HIROYUKI

分类号:H01L29/78;H01L21/336

主分类号:H01L29/78

摘要:The semiconductor device comprises a word line and a bit line. The word line comprises a gate electrode and a first metal interconnect. The first metal interconnect has contact with the gate electrode and extends into a region upper than a first impurity-diffused region in a first direction. The bit line comprises a connecting part and a second metal interconnect. The connecting part is formed so as to have contact with at least part of the side surface of the first impurity-diffused region. The second metal interconnect has contact with the connecting part and extends into a region lower than the semiconductor region in a second direction orthogonal to the first direction.

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