SAMPLE MEASURING DEVICE,申请号JP20060229914-传众专利搜索

SAMPLE MEASURING DEVICE

申请公布号：JP2008051723(A)

申请号：JP20060229914

申请日期：2006.08.25

申请公布日期：2008.03.06

申请人：

SYSMEX CORP

发明人：FUJITA TAKAZOU;FUJINO HIROYUKI;MISHIMA YOSHIHIRO

分类号：G01N35/00

主分类号：G01N35/00

摘要：PROBLEM TO BE SOLVED: To provide a sample measuring device capable of performing easily retrieval of measurement information and its result display. SOLUTION: This device is equipped with a measuring part for measuring a sample, a measurement information accumulation means for generating and accumulating measurement information of the sample including state information showing the state of measurement following progression of measurement, an extraction information setting means 413b for setting and registering by a user extraction information including an extraction condition on the state of sample measurement in order to extract the accumulated measurement information, a selection means 414 for selecting by the user the extraction information registered by the extraction information setting means 413b, an extraction means 411 for extracting the accumulated measurement information following the extraction information selected by the selection means 414, and a display part 412 for displaying the measurement information extracted by the extraction means 411. COPYRIGHT: (C)2008,JPO&INPIT