,申请号JP19880207620-传众专利搜索

申请公布号：JP2502699(B2)

申请号：JP19880207620

申请日期：1988.08.22

申请公布日期：1996.05.29

申请人：

MATSUSHITA ELECTRIC IND CO LTD

发明人：TAKAHARA HIROSHI

分类号：G01R31/00;G02F1/13;G02F1/1345;G02F1/136;G02F1/1368;(IPC1-7):G02F1/13;G02F1/134

主分类号：G01R31/00

摘要：<p>PURPOSE:To reduce the time for inspection of the panel and cost of an inspecting apparatus by mounting ICs for driving to the panel after formation of the panel and operating the IC for driving. CONSTITUTION:The IC 24 for gate driving is mounted to an IC terminal connecting electrode 10. The IC for source driving is mounted to the IC terminal connecting electrode. The IC terminal connecting electrode and the IC terminal electrode are electrically connected via a projecting electrode and a conductive joint layer. Heat is then impressed to the conductive adhesive layer to put the joint layer into a tentatively cured state. The IC 24 is then operated to impress the signal to turn off all the thin film transistors TFTs. The signal of a square waveform is impressed to a gate signal wire and the voltage impression state to a picture element electrode is measured by a photodecting means. This measurement is executed by applying the signal successively to the respective gate signal lines. The IC for source driving is then operated and the similar inspection is executed. The inspection of the liquid crystal panel is executed by operating the ICs for driving connected in such a manner.</p>