Compound semiconductor device.
申请公布号:EP0539690(A2)
申请号:EP19920114718
申请日期:1992.08.28
申请公布日期:1993.05.05
发明人:NAKAGAWA, YOSHIKAZU
分类号:H01L29/812;H01L21/338;H01L29/08;H01L29/36;H01L29/778
主分类号:H01L29/812
摘要:<p>A compound semiconductor device includes an undoped semiconductor layer; a doped semiconductor layer formed on the undoped semiconductor layer and having smaller electron affinity than the undoped semiconductor layer, impurities being doped in the doped semiconductor layer; a gate electrode formed on the doped semiconductor layer; and a source electrode and a drain electrode respectively formed at both sides of the gate electrode, wherein an impurity concentration of the doped semiconductor layer is selected such that a portion of the doped semiconductor layer located immediately below the gate electrode is not completely depleted in a state in which a gate voltage is not applied to the gate electrode, and is completely depleted in a state in which a negative voltage for minimizing a noise figure is applied to the gate electrode. <IMAGE></p>
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