WAVEFORM TESTING PROCESSOR,申请号JP19840135940-传众专利搜索

WAVEFORM TESTING PROCESSOR

申请公布号：JPS6114582(A)

申请号：JP19840135940

申请日期：1984.06.30

申请公布日期：1986.01.22

申请人：

TOSHIBA KK

发明人：ISHII KEIYOU;MORI KEIJI

分类号：G01S3/04;(IPC1-7):G01S3/04

主分类号：G01S3/04

摘要：PURPOSE:To remove an improper azimuth indication pattern by digitizing and comparing an azimuth indication pattern, obtained corresponding to an angle of rotation from an arrival radio wave, with a reference level and counting the frequency of crossing of the both and testing the waveform. CONSTITUTION:An antenna 21 is connected to a goniometer system 22 to constitute a rotary directional antenna system, whose output is detected by a reception system 23, which transfers an azimuth indication pattern corresponding to the rotational angle of the antenna 21 to a processing computer 25 through an A/D converter 24. Then, the computer 25 inputs pulses for counting and reference pulses to count the pulses for counting, and calculates the azimuth from the difference of the counted value from the number of the reference pulses. Simultaneously, the number of times of crossing of the digitized signal of the azimuth indication pattern and decision reference level is calculated and when the number of times of crossing is larger than a specific value, the pattern is removed as an improper indication pattern which is affected by interference, etc.