COMPONENT INSPECTION DEVICE,申请号JP20150050564-传众专利搜索

COMPONENT INSPECTION DEVICE

申请公布号：JP2016170082(A)

申请号：JP20150050564

申请日期：2015.03.13

申请公布日期：2016.09.23

申请人：

SEIKO INSTRUMENTS INC

发明人：OIDE KOJI;KUMEMOTO NAO

分类号：G01N21/88;G01B11/24;G01B11/28

主分类号：G01N21/88

摘要：PROBLEM TO BE SOLVED: To provide a component inspection device capable of maintaining conditions for capturing good images of components.SOLUTION: An inspection device 1 is held to face a component 10 such that a penetrating direction of through-holes coincides with a direction lateral (perpendicular) to the direction of gravity. A light source for illumination 5 is provided on one side in a direction lateral to the component 10 to irradiate the through-holes with light, and the light passing through the through-holes of the component 10 is captured by a camera 6 located on the opposite side. The inspection device 1 uses captured image data to analyze area of sections where light passes through in a region with the through-holes, and determines that the component is defect-free when the area is no less than a reference value and that the component is defective when the area is less than the reference value.SELECTED DRAWING: Figure 1