DECOMPRESSION PROCESSING APPARATUS
申请公布号:JP2016171291(A)
申请号:JP20150051884
申请日期:2015.03.16
申请公布日期:2016.09.23
发明人:IIDA HIDEKAZU
分类号:H01L21/3065;B65G49/07;H01L21/677;H01L21/683
主分类号:H01L21/3065
摘要:PROBLEM TO BE SOLVED: To allow a wafer to be separated from an electrostatic chuck and conveyed, without providing any special mechanism for carrying out the wafer to a plasma processing apparatus.SOLUTION: Application of a high frequency voltage between an electrostatic chuck 3 and an upper electrode is stopped after processing a wafer W. The suction holding surface 81 of a conveyance pad 8 is brought into contact with the upper surface W1 of the wafer W, and the wafer W is connected with the earth. Positive charges on the upper surface W1 of the wafer W are then removed, and the suction holding surface 81 is interconnected with a suction source 86 thus suction holding the wafer W. Thereafter, drive means 87 separates a plate-like work W from the electrostatic chuck 3 and carries out the wafer W from a chamber.SELECTED DRAWING: Figure 8
Potential-free measurement of output current
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