SIGNAL DETECTION CIRCUIT AND SCANNING PROBE MICROSCOPE,申请号EP20140774604-传众专利搜索

SIGNAL DETECTION CIRCUIT AND SCANNING PROBE MICROSCOPE

申请公布号：EP2980590(A4)

申请号：EP20140774604

申请日期：2014.03.04

申请公布日期：2016.11.23

申请人：

NATIONAL UNIVERSITY CORPORATION KANAZAWA UNIVERSITY

发明人：FUKUMA, TAKESHI;MIYATA, KAZUKI

分类号：G01Q10/06;G01Q60/32;H03D3/00;H03D7/16

主分类号：G01Q10/06

摘要：A signal detection circuit (1) includes: a VCO (23) that generates a reference signal; a complex signal generation circuit that generates a complex signal from an input signal and the reference signal; a vector operation circuit (27) that calculates an argument of the complex signal by performing a vector operation; and a subtracting phase comparator (28) that compares the argument with a phase of the reference signal by calculating a difference between the argument and the phase of the reference signal, wherein the complex signal generation circuit includes: a multiplication circuit (24) that multiplies the input signal by the reference signal; and an HPF (26) that removes a DC component from a signal output from the multiplication circuit (24).