IMPULSE VOLTAGE CUTTING WAVE TESTING DEVICE,申请号JP20150115494-传众专利搜索

IMPULSE VOLTAGE CUTTING WAVE TESTING DEVICE

申请公布号：JP2016052243(A)

申请号：JP20150115494

申请日期：2015.06.08

申请公布日期：2016.04.11

申请人：

MITSUBISHI ELECTRIC CORP

发明人：SHIBATA TAKUKI;HINO NOBUHIRO;UENO DAISUKE;HORASAKI HIROSHI

分类号：H02M9/00

主分类号：H02M9/00

摘要：PROBLEM TO BE SOLVED: To provide an impulse voltage cutting wave testing device that is able to generate an impulse voltage cutting wave even when an output start time for an impulse voltage varies.SOLUTION: The impulse voltage cutting wave testing device comprises: an impulse voltage generating device 10 that outputs an impulse voltage VIP in response to a start signal S1; a cutting signal generator 3 that outputs a first cutting signal S2 the start signal S1 for which is delayed; a cutting signal generator 4 that outputs a second cutting signal S3 in response to the impulse voltage VIP; and a cutting device 15 that cuts the impulse voltage VIP when the impulse voltage VIP has been output and the cutting signal S2 or S3 is output. Accordingly, impulse voltage VIP can securely be cut.SELECTED DRAWING: Figure 1