INTEGRATED CIRCUIT DEFECT DETECTION AND REPAIR,申请号WO2014US72003-传众专利搜索

INTEGRATED CIRCUIT DEFECT DETECTION AND REPAIR

申请公布号：WO2015100273(A1)

申请号：WO2014US72003

申请日期：2014.12.22

申请公布日期：2015.07.02

申请人：

INTEL CORPORATION

发明人：QUERBACH, BRUCE;SCHOENBORN, THEODORE Z.;ZIMMERMAN, DAVID J.;ELLIS, DAVID G.;HAMPSON, CHRISTOPHER W.;WAN, IFAR;ZHANG, YULAN;MALLELA, RAMAKRISHNA;LUI, WILLIAM K.

分类号：G06F11/07;G06F11/263

主分类号：G06F11/07

摘要：In accordance with the present description, a device includes an internal defect detection and repair circuit which includes a self-test logic circuit built in within the device and a self-repair logic circuit also built in within the device. In one embodiment, the built in self-test logic circuit may be configured to automatically identify defective memory cells in a memory. Upon identifying one or more defective memory cells, the built in self-repair logic circuit may be configured to automatically repair the defective memory cells by replacing defective cells with spare cells within the memory. In one embodiment, data patterns are generated as a function of memory addresses and periodic address offsets. Other aspects are described herein.