SYSTEM ANT METHOD FOR DIAGNOSING THERMAL IMAGE OF 2D ARRAY,申请号KR20140057058-传众专利搜索

SYSTEM ANT METHOD FOR DIAGNOSING THERMAL IMAGE OF 2D ARRAY

申请公布号：KR101411564(B1)

申请号：KR20140057058

申请日期：2014.05.13

申请公布日期：2014.06.26

申请人：

KDT CO., LTD.

发明人：KWON, YOUNG BOK

分类号：G01N25/20;G01J5/48;G01N21/00;G01R31/02;G08B21/18

主分类号：G01N25/20

摘要：Disclosed are a system and a method for diagnosing a thermal image capable of carefully diagnosing the temperature and deterioration of an electric power facility, such as a switch board and a panel board, to prevent accidents in advance. The present invention comprises a monitoring section data generation part for generating image data as a result of photographing the monitoring section of a monitored object using a thermal image sensor; a standard value setting part for setting standard value items including a standard temperature and a standard deterioration rate applied to multiple monitoring sections if the monitoring section is divided into the multiple sections; a deterioration calculation part for calculating the temperature and deterioration rate of the monitoring sections by applying the set standard value items to the image data; and an warning processing part for issuing a temperature warning state and a deterioration warning state if the calculated temperature and deterioration rate are higher than the standard value items by comparing the calculated temperature with the standard temperature and the calculated deterioration rate with the standard rate. Thus, the present invention can prevent malfunctions and accidents caused by deterioration in advance.