Solid state drive systems and methods of reducing test times of the same,申请号US20090576543-传众专利搜索

Solid state drive systems and methods of reducing test times of the same

申请公布号：US8331175(B2)

申请号：US20090576543

申请日期：2009.10.09

申请公布日期：2012.12.11

申请人：

BANG KWANG-KYU;PARK KWAN-JONG;KIM HYUN-SOO;SAMSUNG ELECTRONICS CO., LTD.

发明人：BANG KWANG-KYU;PARK KWAN-JONG;KIM HYUN-SOO

分类号：G11C29/00

主分类号：G11C29/00

摘要：According to example embodiments, a solid state drive system includes at least one semiconductor memory, a control circuit including first connection terminals, and second connection terminals. The first connection terminals may be configured to supply one or more operational voltages to the at least one semiconductor memory. The second connection terminals may be configured to supply one or more test voltages to the at least one semiconductor memory.