HIGH SPEED DISTRIBUTED OPTICAL SENSOR INSPECTION SYSTEM,申请号WO2011US59040-传众专利搜索

HIGH SPEED DISTRIBUTED OPTICAL SENSOR INSPECTION SYSTEM

申请公布号：WO2012061543(A3)

申请号：WO2011US59040

申请日期：2011.11.03

申请公布日期：2012.09.27

申请人：

CYBEROPTICS CORPORATION;LIBERTY, TODD, D.;SKUNES, TIMOTHY, A.;HAUGAN, CARL, E.;CHEN, CHUANQI;CARUSO, BEVERLY

发明人：LIBERTY, TODD, D.;SKUNES, TIMOTHY, A.;HAUGAN, CARL, E.;CHEN, CHUANQI;CASE, STEVEN, K.

分类号：H05K13/08;G01N21/88;G01N21/956;H04N13/00

主分类号：H05K13/08

摘要：An electronics assembly line (110) includes a first electronics assembly machine (114) and a second electronics assembly machine (116). The first electronics assembly machine has a first electronics assembly machine outlet (114). The second electronics assembly machine has a second electronics assembly machine inlet and outlet. The inlet of the second electronics assembly machine (116) is coupled to the outlet of the first electronics assembly machine (114) by a conveyor (124). A first optical inspection sensor (132) is disposed over the conveyor (124) before the inlet of the second electronics assembly (116) and is configured to provide first sensor inspection image data relative to a substrate that passes beneath the first optical inspection sensor (132) in a non-stop fashion. A second optical inspection sensor (134) is disposed over the conveyor (126) after the outlet of the second electronics assembly machine (116) and is configured to provide second sensor inspection image data relative to a substrate that passes beneath the second optical inspection sensor (134) in a non-stop fashion. A computer (77) is operably coupled to the first and second optical inspection sensors (132, 134) and is configured to provide an inspection result based upon at least one of the first and second inspection image data.