MEASURING SEEBECK COEFFICIENT,申请号WO2012US26389-传众专利搜索

MEASURING SEEBECK COEFFICIENT

申请公布号：WO2012116227(A2)

申请号：WO2012US26389

申请日期：2012.02.23

申请公布日期：2012.08.30

申请人：

CALIFORNIA INSTITUTE OF TECHNOLOGY;SNYDER, G., JEFFREY

发明人：SNYDER, G., JEFFREY

分类号：G01N25/18;H01L35/28

主分类号：G01N25/18

摘要：A high temperature Seebeck coefficient measurement apparatus and method with various features to minimize typical sources of errors is described. Common sources of temperature and voltage measurement errors which may impact accurate measurement are identified and reduced. Applying the identified principles, a high temperature Seebeck measurement apparatus and method employing a uniaxial, four-point geometry is described to operate from room temperature up to 1300K. These techniques for non-destructive Seebeck coefficient measurements are simple to operate, and are suitable for bulk samples with a broad range of physical types and shapes.