METHOD FOR FABRICAING SEMICONDUCTOR DEVICE HAVING SILICON ON INSULATOR STRUCTURE
申请公布号:KR20100110534(A)
申请号:KR20090028912
申请日期:2009.04.03
申请公布日期:2010.10.13
发明人:BAEK, SEUNG BEOM;AHN, TAE HANG;LEE, YOUNG HO;LEE, MI HYOUNG;KIM, TAE JUNG
分类号:H01L27/12;H01L21/20
主分类号:H01L27/12
摘要:PURPOSE: A method for manufacturing a semiconductor device with an SOI structure is provided to reduce manufacturing processes by omitting processes for forming and removing a silicon Ge layer. CONSTITUTION: An SOI insulation layer pattern(21A) is formed on a silicon wafer(20). A silicon layer(22) is formed on the surface including the SOI insulation layer. A device isolation trench is formed by etching the silicon layer and the silicon wafer. The device isolation layer is formed by burying the device isolation trench.
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