Apparatus and method for measuring the current consumption and the capacitance of a semiconductor device,申请号US20070725556-传众专利搜索

Apparatus and method for measuring the current consumption and the capacitance of a semiconductor device

申请公布号：US7646206(B2)

申请号：US20070725556

申请日期：2007.03.20

申请公布日期：2010.01.12

申请人：

INFINEON TECHNOLOGIES AG

发明人：MIELKE FRANK C.

分类号：G01R27/26

主分类号：G01R27/26

摘要：A measuring apparatus is provided which has least one voltage source for providing a supply voltage for a semiconductor device to be tested, at least one first tester channel connected to the supply voltage source via a first RC element having a first resistor and a first capacitor connected in series therewith, wherein the first tester channel is adapted for the temporally resolved measurement of a charging voltage of the first capacitor.