SPECTROMETER
申请公布号:JP2009210474(A)
申请号:JP20080055145
申请日期:2008.03.05
申请公布日期:2009.09.17
发明人:URABE SHINICHI
分类号:G01J3/02;H01L31/10
主分类号:G01J3/02
摘要:PROBLEM TO BE SOLVED: To provide a spectrometer for detecting a plurality of wavelengths by controlling the discrete level by the thickness of a quantum well. SOLUTION: This spectrometer comprises a first and second layers between which an electric field is formed, a first and second insulating layers connected to the first and second layers, respectively, the discrete level that is arranged between the first and second layers via the first and second insulating layers and is on the electron side lower than the bottom of the conduction band of any of the first and second insulating layers, a plurality of quantum well layers having a thickness so as to have a positive hole side discrete level lower than the top of the valence electron band of any of the first and second insulating layers, and a current detecting means that is electrically connected to the first and second layers and detects current flowing between the first and second layers via the quantum well layers when the quantum well layers receive the light. A plurality of kinds of layer thicknesses of the plurality of quantum well layers are set. COPYRIGHT: (C)2009,JPO&INPIT