METHOD AND APPARATUS FOR PARAMETER SCANNING FOR SIGNAL OVER-SAMPLING, AND NETWORK SYSTEM,申请号JP20070270672-传众专利搜索

METHOD AND APPARATUS FOR PARAMETER SCANNING FOR SIGNAL OVER-SAMPLING, AND NETWORK SYSTEM

申请公布号：JP2008154214(A)

申请号：JP20070270672

申请日期：2007.09.18

申请公布日期：2008.07.03

申请人：

SILICON IMAGE INC

发明人：CHOI HOON

分类号：H04B3/06;H03M3/02;H04N17/00

主分类号：H04B3/06

摘要：PROBLEM TO BE SOLVED: To provide a method and an apparatus for parameter scanning for signal over-sampling. SOLUTION: An embodiment of an apparatus includes an equalizer to equalize received data values, and a sampler to over-sample the equalized data. The apparatus includes an eye monitor to generate information regarding quality of signal eyes for the over-sampled data, and an equalization monitor to generate information regarding sufficiency of signal equalization. The apparatus further includes a scan engine to scan possible values of a plurality of parameters for the apparatus. COPYRIGHT: (C)2008,JPO&INPIT