Thermal trip device and circuit breaker using the same,申请号US20040592003-传众专利搜索

Thermal trip device and circuit breaker using the same

申请公布号：US2007195478(A1)

申请号：US20040592003

申请日期：2004.04.21

申请公布日期：2007.08.23

申请人：

MITSUBISHI ELECTRIC CORPORATION

发明人：KAWAMURA KOUJI;AKITA HIROYUKI;MURAI MASATOSHI;YONEZAWA HIROTOSHI;NAITO SATORU

分类号：H02H5/04;H01H71/16;H01H73/02

主分类号：H02H5/04

摘要：A thermal trip device in which a bimetal ( 2 ) is heated by overcurrent and performs trip operation of a circuit by curvature of the heated bimetal ( 2 ), wherein at least one part of the surface of the bimetal ( 2 ) is made to be black or matte black ( 7 ). Thereby, temperature of the bimetal ( 2 ) can be highly accurately measured using a no-contact thermometer. Furthermore, a temperature measurement part ( 8 ) of the bimetal is provided with a bending part ( 11 ), and the surface of the bending part is made to be matte black.