Semiconductor device and testing method thereof
申请公布号:US2005122300(A1)
申请号:US20040981715
申请日期:2004.11.05
申请公布日期:2005.06.09
发明人:MAKUUCHI MASAMI;CHUJO NORIO;IMAGAWA KENGO;ORIHASHI RITSURO;ARAI YOSHITOMO
分类号:G01R31/316;G01R31/28;G02F1/133;G09G3/00;G09G3/20;G09G3/36;H01L21/822;H01L27/04;(IPC1-7):G09G3/36
主分类号:G01R31/316
摘要:A semiconductor device according to the present invention has a liquid crystal driver circuit, and when gray-scale voltage thereof is tested, the gray-scale voltage (Vx) generated in a gray-scale voltage generator circuit provided therein is compared with reference voltage (e.g., Vx+DeltaV) generated for testing the gray-scale voltage and the test result is output as binarized voltage from external terminals of the semiconductor device. This can speed up the gray-scale voltage test even in the case of higher gray scale in the liquid crystal driver circuit or increased number of output terminals of the semiconductor device. Therefore, it becomes possible to reduce the time and cost required for the test.
PROCEDIMIENTO DE RECICLADO DE MATERIALES SINTETICOS DUROPLASTICOS NO REFORZADOS CON FIBRAS.
NAPA DE HILATURA, COMPACTADA CON LIGANTE TERMOFUSIBLE.
VENTILADOR DE FLUJO AXIAL Y ORIFICIO DE VENTILADOR.
COMPOSICIONES POLIMERICAS Y SU USO EN CIERRES DE RECIPIENTE.
DISPOSITIVO DE CONTROL PARA APARATO MEDICO.
PESE-LETTRE DE MACHINE A AFFRANCHIR ET MACHINE A AFFRANCHIR RESULTANTE
PROTHESE DE HANCHE A TETE FEMORALE EXTRACTIBLE ET OUTIL D'EXTRACTION.
MAQUINA PARA LA FABRICACION DE BISAGRAS.
PROCEDIMIENTO PARA AUMENTAR EL TAMA/O DE PARTICULA DE UN CAUCHO
TRAIN D'ATTERRISSAGE RELEVABLE EQUIPE D'UNE CONTRE-FICHE ARTICULEE A DOUBLE ALIGNEMENT.