首页 > 专利信息

THEFT MONITORING METHOD AND THEFT MONITORING SYSTEM

申请公布号:JP2005022621(A)

申请号:JP20030270929

申请日期:2003.07.04

申请公布日期:2005.01.27

申请人:
KENWOOD CORP

发明人:HASHIGUCHI YUZURU

分类号:B60R25/102;B60R25/30;B60R25/33;(IPC1-7):B60R25/10

主分类号:B60R25/102

摘要:<p><P>PROBLEM TO BE SOLVED: To provide a theft monitoring system capable of determining theft occurrence more securely. <P>SOLUTION: A moving condition of a vehicle 4 to be monitored is detected, and existence of the other vehicle 5 parallely moving in the same direction as that of the vehicle 4 is detected at the time of detecting movement, so as to determine whether the movement of the vehicle 4 is abnormal or not based on identification information transmitted from the other vehicle 5. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>

专利推荐

METHOD FOR DETERMINING A STATE OF CHARGE AND REMAINING OPERATION LIFE OF A BATTERY

SIGNAL IDENTIFICATION METHODS AND SYSTEMS

THROUGH PROCESS FLOW INTRA-CHIP AND INTER-CHIP ELECTRICAL ANALYSIS AND PROCESS CONTROL USING IN-LINE NANOPROBING

BREATH ANALYSIS SYSTEM

MULTIPARAMETRIC METHOD FOR ASSESSING IMMUNE SYSTEM STATUS

Method for using nanodiamonds to detect nearby magnetic nanoparticles

Device and Method for Monitoring and Quantifying Analytes

APPARATUS AND METHOD FOR SURVEYING

Particle Analyzing Device

THIN LAYER CHROMATOGRAPHY PLATES AND RELATED METHODS

DISCHARGE IONIZATION CURRENT DETECTOR

APPARATUS AND METHOD FOR PREVENTING MALFUNCTION IN AN ELECTRONIC DEVICE

INTEGRATED SPECTRAL PROBE FOR RAMAN, REFLECTANCE AND FLUORESCENCE SPECTRAL MEASUREMENTS

PROBE USING ULTRAVIOLET AND INFRARED RADIATION FOR MULTI-PHASE FLOW ANALYSIS

METHOD FOR FINDING SHEAR RATE OF FLUID, AND PROGRAM AND DEVICE FOR SAME

IMAGING MICROVISCOMETER

STRESS DETECTION DEVICE FOR LIGHT-TRANSMISSIVE STRUCTURE AND STRESS DETECTION METHOD FOR THE SAME

APPARATUS AND METHOD FOR SERVICE REPLACEMENT OF DAMAGED EXHAUST TEMPERATURE SENSOR MOUNTING BOSS

ELECTRONIC TEMPERATURE SENSOR FOR MEASURING THE JUNCTION TEMPERATURE OF AN ELECTRONIC POWER SWITCH DURING OPERATION, AND METHOD FOR MEASURING THE TEMPERATURE OF THE JUNCTION BY THIS ELECTRONIC SENSOR

LEVEL MEASUREMENT SYSTEM