STRUCTURE FOR COMMUNICATION PART OF TEST JIG FOR TEMPERATURE CONTROLLER,申请号KR20010078431-传众专利搜索

STRUCTURE FOR COMMUNICATION PART OF TEST JIG FOR TEMPERATURE CONTROLLER

申请公布号：KR20030048517(A)

申请号：KR20010078431

申请日期：2001.12.12

申请公布日期：2003.06.25

申请人：

HAN, YONG SU

发明人：HAN, YONG SU

分类号：G01B5/02;(IPC1-7):G01B5/02

主分类号：G01B5/02

摘要：PURPOSE: A structure for a communication part of a test jig is provided to improve the reliability of the communication part of the test jig by guiding a movement of a moving member using a supporting pin and a lever. CONSTITUTION: A communication part of a test jig includes a body(51) having a box shape. A lever(52a) is moved in forward and backward directions within a perforation hole formed in the body(51). A moving member having a protrusion is integrally formed with the lever(52a). A communication pin(53) is fixed to the other portion of the lever. The communication pin(53) makes contact with a printed circuit board of an article as the moving member moves. A fixing lock(54) is installed at an upper portion of the body(51). A supporting pin is moved in an inner portion of a guide rod fixed to the moving member.