MEMORY BIST EMPLOYING A MEMORY BIST SIGNATURE
申请公布号:WO2003034439(A2)
申请号:US2002031883
申请日期:2002.10.07
申请公布日期:2003.04.24
摘要:<p>A method and apparatus for performing a built-in self-test ('BIST') on an integrated circuit device are disclosed. More particularly, in a first aspect, a BIST controller includes a memory built-in self-test ('MBIST') engine and a MBIST test signature register. The MBIST engine is capable of performing a MBIST and the MBIST signature register is capable of storing the results of the MBIST. In a second aspect, a method for performing a MBIST includes first externally resetting a MBIST engine and a MBIST signature register. Next, the method initiates a plurality of components and signals in a MBIST engine and the MBIST signature register upon receipt of at least one of a MBIST run signal and a MBIST select signal. The contents of a plurality of memory components are then flushed to a known state. The flushed memory components are then tested and the results of the testing are stored in the MBIST signature register.</p>
UV-HAERDELIGT OVERTRAEKSMATERIALE INDEHOLDENDE EN NITROGENHOLDIG ACCELERATOR
DEVICE FOR POSITIONING ROTATION OF SEMICONDUCTOR WAFER
FOERBAETTRINGAR AVSEENDE MAERKNINGAR AV OMSLAGSPAPPER FOER TOBAKSPRODUKT.
PREPARAT OG FREMGANGSMAATE FOR ELEKTROAVSETNING AV ZN- ELLER ZN/SI/P-BELEGG PAA METALLSUBSTRATER.
INDICATEUR OPTIQUE DU NIVEAU D'UN LIQUIDE.
DOUBLE INJECTION FIELD EFFECT TRANSISTORS
CONTROLLED ENVIRONMENT FOR GERMINATION OF SEEDS
APPARATUS FOR DETECTING CLOUDINESS OF WINDOWPANE OF AUTOMOBILE
METHOD OF CONTROLLING OPERATION OF REFRIGERATING OPEN SHOWCASE