PARTICLE DIAMETER DISTRIBUTION-MEASURING DEVICE AND METHOD,申请号JP19990266182-传众专利搜索

PARTICLE DIAMETER DISTRIBUTION-MEASURING DEVICE AND METHOD

申请公布号：JP2001033376(A)

申请号：JP19990266182

申请日期：1999.09.20

申请公布日期：2001.02.09

申请人：

HORIBA LTD

发明人：YAMAGUCHI TETSUJI

分类号：G01N15/02;(IPC1-7):G01N15/02

主分类号：G01N15/02

摘要：PROBLEM TO BE SOLVED: To provide a particle diameter distribution-measuring device and method for obtaining more accurate particle diameter distribution by compensating for the decrease in scattered light due to the diameter of particles being characterized by the color of a sample to be measured and Mie scattering. SOLUTION: In a particle diameter distribution-measuring device 1 for applying a laser beam L to a sample 2 to be measured, converting generated scattered light Ls to an electrical detection signal, performing the inverse operation of the detection signal and calculating the particle diameter distribution of a particle 2a included in a sample, the particle diameter distribution measuring method uses a laser beam emission part 3 for changing the wavelength of the laser beam L to be applied according to the sample 2 and a particle diameter distribution analysis part 1 a for analyzing the particle diameter distribution of the particle 2a included in the sample 2 by scattered light Ls from the sample when a laser beam with wavelength for measuring the strongest scattered light Ls from the sample 2 to be measured is applied.