MEMORY TESTER WITH DATA COMPRESSION,申请号KR19997004393-传众专利搜索

MEMORY TESTER WITH DATA COMPRESSION

申请公布号：KR20000053363(A)

申请号：KR19997004393

申请日期：1999.05.18

申请公布日期：2000.08.25

申请人：

TERADYNE, INC.

发明人：BROWN BENJAMIN J.;GAGE ROBERT B.;DONALDSON JOHN F.;JOFFE ALEXANDER

分类号：G01R31/28;G01R31/319;G01R31/3193;G11C29/00;G11C29/40;G11C29/44;G11C29/56;(IPC1-7):G11C29/00

主分类号：G01R31/28

摘要：PURPOSE: A memory tester with data compression is provided for lossless compression of data and for multiple display formats of the data. CONSTITUTION: A pattern generator(118) provides pattern inputs to numerous pin electronics circuits(120). A lossy compressor(210) of a display processor(122) receives input data and then outputs data streams indicating failure of corresponding bits of a MUT(16). The outputs are applied to a programmable gate(212) in order to express data on a display(111) in a form of easily analyzing the failures, combines outputs of the lossy compressor(210) with outputs of a RLE de-compressor(224) or inverses the data streams. The outputs of the programmable gate(212) is received into the lossy compressor(214) and then provided to a RLE compressor(216). Results from the RLE compressor(216) are stored in a display memory(126). Information stored in the display memory(126) is graphically displayed during a test by the MUT(116) or passed to the programmable gate(212).