APPARATUS FOR MEASURING MICROWAVE DISTANCE USING TWO OR MORE REFERENCE LINE,申请号KR19990028775-传众专利搜索

APPARATUS FOR MEASURING MICROWAVE DISTANCE USING TWO OR MORE REFERENCE LINE

申请公布号：KR20010010086(A)

申请号：KR19990028775

申请日期：1999.07.15

申请公布日期：2001.02.05

申请人：

POHANG IRON & STEEL CO., LTD.;POHANG RESEARCH INSTITUTE OF INDUSTRIAL SCIENCE &TECHNOLOGY

发明人：JUN, JUNG CHANG;KIM, JEONG MOK;LIM, JONG SU

分类号：G01S13/50;(IPC1-7):G01S13/50

主分类号：G01S13/50

摘要：PURPOSE: An apparatus for measuring a microwave distance using two or more reference line is provided to improve the measurement accuracy, to simplify the construction, and to reduce the production cost. CONSTITUTION: A voltage control oscillator(20) outputs a microwave signal. The microwave signal is transmitted via a switch(32) to an antenna(30). The switch is selectively switched to any one of a first contact point(S1), a second contact point(S2) and a third contact point(S3) via a circulator(31). An electromagnetic energy radiated from the antenna is reflected to an obstacle, and is returned to the antenna after a delay time. The delay time is proportional to a distance to the obstacle. When the reflected signal is reached to a mixer(40), the mixer(40) generates a frequency difference corresponding the product of an output of the oscillator, the delay time, and a modulation factor. The frequency difference is a beat frequency. When an output of the mixer passes a low threshold passage filter(50), a middle frequency having the beat frequency is obtained. After being converted to a frequency range, the middle frequency is saved in a memory(80). The memory is connected with a calculator(90) to display a measurement result using a signal processor(100).