SPECIFIC ELECTRIC CHARGE MEASURING METHOD AND APPARATUS FOR CHARGE PARTICLE,申请号JP19960129672-传众专利搜索

SPECIFIC ELECTRIC CHARGE MEASURING METHOD AND APPARATUS FOR CHARGE PARTICLE

申请公布号：JPH09311154(A)

申请号：JP19960129672

申请日期：1996.05.24

申请公布日期：1997.12.02

申请人：

FUJI XEROX CO LTD

发明人：MIYAMOTO YASUMASA;YAMADA TAKAYUKI;KYOZUKA SHINYA;NAKAMURA TAKESHI

分类号：G01R29/24;G01N27/60;G03G9/08;(IPC1-7):G01R29/24

主分类号：G01R29/24

摘要：<p>PROBLEM TO BE SOLVED: To provide a specific electric charge measuring method and apparatus for charged particles which can carry out measurement at high precision within a short measurement time with a small size. SOLUTION: This specific charge measuring apparatus comprises a fan 13 to generate air current 11 flowing in the direction A, an electric field forming means which has a pair of parallel electrodes 12a, 12b so installed as to be on the opposite to each other and parallel to the direction A and forms an electric field between the parallel electrodes 12a, 12b, and a photosensor 16 which has a cross section 15 so set as to pass toner particles 1 charged by passing between the parallel electrodes 12a, 12b through and detects the cross-section points 15a in the cross-section 15 at which the toner particles 1 are passed through. Based on the position information of the cross-section 15 detected by the photosensor 16, the specific charge of toner particles 1 is computed.</p>