Process for treating a garbage disposal

申请公布号：US5279444(A)

申请号：US19920822187

申请日期：1992.01.16

申请公布日期：1994.01.18

申请人：

HTIEK COMPANY, INC.

发明人：WILLIAMS, KEITH E.

分类号：B65D83/14;(IPC1-7):B65D83/00

主分类号：B65D83/14

摘要：A process for treating a garbage disposal unit by spraying material into its inlet is disclosed. The process utilizes a specified device, which contains an aerosol propellant container and a substantially cylindrical adaptor The adaptor is integrally formed, with both an upwardly-extending lip section and a downwardly-extending bottom section. The upwardly-extending lip section contains at least three flange portions separated by slots in which movable tabs are disposed. The downwardly-extending bottom section contains an orifice.

MULTI-POINT MEASURING DEVICE

HEAT DEVELOPABLE PHOTOSENSITIVE MATERIAL AND IMAGE FORMING METHOD THEREFOR

VIDEO TOOL CONTROL METHOD FOR IMAGE INSPECTION SYSTEM

INSTRUMENT FOR MEASURING EXHAUST GAS

VISCOSITY MEASURING DEVICE

PROCESSING VESSEL, PROCESSING METHOD AND PROCESSOR FOR PIECE SAMPLE

POSITIONING SYSTEM, TERMINAL DEVICE, CONTROL METHOD OF TERMINAL DEVICE, CONTROL PROGRAM OF TERMINAL DEVICE, AND COMPUTER READABLE RECORDING MEDIUM HAVING RECORDED CONTROL PROGRAM OF TERMINAL DEVICE

INSTRUMENT AND METHOD FOR TESTING SEMICONDUCTOR CIRCUIT

LIQUID PHYSICAL PROPERTY VALUE MEASURING INSTRUMENT AND LIQUID PHYSICAL PROPERTY VALUE MEASURING METHOD

RESONATOR EXCITING METHOD AND MEASURING METHOD OF ELECTROMAGNETIC PHYSICAL PROPERTY VALUES

DEVICE AND METHOD FOR CORRECTING BALANCE

PROBE UNIT, PROBE ASSEMBLY, AND INSPECTION METHOD OF ELECTRONIC DEVICE

OPTICAL ROTATION ANGLE DETECTION APPARATUS

METHOD OF DETECTING SLOT SHAPE OF SLOT ROD

CROSSLINKING DEGREE MEASURING METHOD OF LINEAR BODY, AND CROSSLINKING DEGREE MEASURING SYSTEM USED

METHOD FOR EVALUATING AND TESTING ADAPTABILITY OF POLLUTION PURIFICATION

LEAKAGE DETECTION METHOD FOR HIGH-PRESSURE GAS UNDERGROUND STORAGE FACILITY, AND HIGH-PRESSURE GAS UNDERGROUND STORAGE FACILITY

TOOL FOR MATERIAL CONSTANT MEASUREMENT

INTENSITY CORRECTION AT OBLIQUE INCIDENCE TO DETECTOR OF DIFFRACTION X-RAY IN X-RAY STRUCTURE ANALYSIS

CONTACT PROBE CARD