Measuring EM interference resistance of digital component assembly - converting noise parameter into binary output signal whose pulse width is extended and optically transferred to evaluation unit,申请号DE19924212751-传众专利搜索

Measuring EM interference resistance of digital component assembly - converting noise parameter into binary output signal whose pulse width is extended and optically transferred to evaluation unit

申请公布号：DE4212751(A1)

申请号：DE19924212751

申请日期：1992.04.16

申请公布日期：1993.10.21

申请人：

LANGER, GUNTER, 01728 BANNEWITZ, DE

发明人：LANGER, GUNTER, 01728 BANNEWITZ, DE

分类号：G01R31/00;G01R31/30;(IPC1-7):G01R31/28;G06F1/30;G06F11/30

主分类号：G01R31/00

摘要：The method involves feeding the noise parameters to be measured to a transducer which converts the parameter into a binary output signal using a dynamic threshold value which can be associated with a static threshold value. Each binary output signal is extended into a pulse of sufficient length for evaluation and its frequency adjusted so that it does not exceed the corner frequency of an optical signal transfer system which carries the signal to an evaluation unit. ADVANTAGE - Enables reliable capture of all types of spike which are optically transferred correctly according to phase and logic state.