Analysis system for ions,申请号DE19873719788-传众专利搜索

Analysis system for ions

申请公布号：DE3719788(C1)

申请号：DE19873719788

申请日期：1987.06.13

申请公布日期：1988.12.29

申请人：

KERNFORSCHUNGSZENTRUM KARLSRUHE GMBH, 7500 KARLSRUHE, DE

发明人：KUEHN, WERNER, DR., 7500 KARLSRUHE, DE

分类号：H01J49/28;(IPC1-7):H01J49/32

主分类号：H01J49/28

摘要：The invention relates to a diagnosis method for a complex ion beam for determining the emittance, the particle type and particle energy by means of a mass spectrograph, in accordance with the parabola method, and a diagnosis system for carrying out this method. This diagnosis system, with its multiple aperture system, and the mutually adjacent electromagnetic field configuration is a combination of an emittance measuring device with a parabolic spectrometer which indicates the particle type and particle energy. An annular channel flat spectrometer is described which decomposes the beam into 41 partial beams during a single high-current pulse, which 41 partial beams are analysed simultaneously. The overall emission behaviour of the generator can be determined with one shot by objective arrangement of these partial beams at different radii and divergence angles with respect to the geometric axis of the high-current generator - an ion diode in the present case.