Method and circuit for measuring the time interval between first and second, in particular aperiodic signals,申请号DE19813118618-传众专利搜索

Method and circuit for measuring the time interval between first and second, in particular aperiodic signals

申请公布号：DE3118618(A1)

申请号：DE19813118618

申请日期：1981.05.11

申请公布日期：1982.11.25

申请人：

AOA APPARATEBAU GAUTING GMBH, 8035 GAUTING, DE

发明人：WEISSER, WERNER, ING.(GRAD.), 8131 ERLING-ANDECHS, DE

分类号：G01R29/02;G04F10/00;(IPC1-7):G04F10/00;G01R25/00;H03K5/26

主分类号：G01R29/02

摘要：In a method for measuring the time interval between first and second, in particular aperiodic signals, a clock generator with an adjustable delay time is started up when a threshold value and the instantaneous voltage of the first signal are identical on the leading or trailing edge of the latter and, at the end of the clock generator delay time, the second signal is sampled and its instantaneous voltage stored in a first or second memory depending on whether the clock generator was activated on the leading or the trailing edge. The difference between the stored instantaneous values in the first and second memory is used to control the delay time of the clock generator, which delay time in the steady-state condition is a measure of the time interval between the first and second signal.