Menetelmä ja mittalaite Abben luvun jatkuvaksi mittaamiseksi,申请号FI20140005433-传众专利搜索

Menetelmä ja mittalaite Abben luvun jatkuvaksi mittaamiseksi

申请公布号：FI20145433(A)

申请号：FI20140005433

申请日期：2014.05.13

申请公布日期：2015.11.14

申请人：

JANESKO OY

发明人：KAMRAT, ESKO

分类号：G01N21/43

主分类号：G01N21/43

摘要：Method and device for measuring the Abbe number in a process liquid. Light generates successively at wavelengths of 486.1 nm, 589.3 nm and 656.3 nm and different light wavelengths are directed successively through a measuring window in the process liquid so total reflection occurs at each wavelength on the measuring window surface and process liquid. Partial light reflected at each wavelength is directed to a sensor, whereby an image forms on the sensor surface; between light and dark boundary region corresponding to each wavelength critical angle, in which total reflection occurs. At each wavelength between light and dark boundary region detection by image analysis. At each wavelength, dependency between light and dark boundary region and refractive-index of process liquid measurement is detected, the Abbe number by refractive-index values obtained from: V D = n D - 1 n F - n C ; nD=refractive-index of process liquid to measure at 589.3 nm; nF=refractive-index at 486.1 nm; and nC=refractive-index at 656.3 nm.