Method and apparatus for photomask plasma etching
申请公布号:US8568553(B2)
申请号:US201113045239
申请日期:2011.03.10
申请公布日期:2013.10.29
发明人:KUMAR AJAY;CHANDRACHOOD MADHAVI R.;LEWINGTON RICHARD;BIVENS DARIN;SABHARWAL AMITABH;PANAYIL SHEEBA J.;OUYE ALAN HIROSHI
分类号:H01L21/306
主分类号:H01L21/306
摘要:A method and apparatus for etching photomasks is provided herein. In one embodiment, the apparatus comprises a process chamber having a support pedestal adapted for receiving a photomask. An ion-neutral shield is disposed above the pedestal and a deflector plate assembly is provided above the ion-neutral shield. The deflector plate assembly defines a gas flow direction for process gases towards the ion-neutral shield, while the ion-neutral shield is used to establish a desired distribution of ion and neutral species in a plasma for etching the photomask.
(A) ;BIOLOGICAL PURE-CULTURED PRODUCT OF STREPTOMYCES SANDAENSIS
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