SEMICONDUCTOR SYSTEM

申请公布号：WO2001056038(P1)

申请号：JP2000000430

申请日期：2000.01.28

申请公布日期：2001.08.02

摘要：<p>A module of memory chips includes a test chip that comprises an ALPG for generating test memory patterns (addresses and data) according to a predefined algorithm, a decision circuit for comparing data written in memory with data read from memory, and storage means for storing the results of comparison (defect addresses).</p>

SINGULAR-VALUE EXPANSION ENCODING SYSTEM

DECODER

METAL EVAPORATED POLYESTER FILM CAPACITOR

QUAD-FLAT-PACKAGE TYPE IC

ISOLATOR USED ALSO AS MODE SEPARATOR FOR MILLIMETRIC WAVES

SIGNAL GENERATOR

PICTURE PROCESSING CIRCUIT

OPTICAL ANGULAR VELOCITY DETECTOR AND MANUFACTURING METHOD THEREOF

SUPERCONDUCTING MAGNET STRUCTURE

METHOD AND SYSTEM FOR PICTURE PROCESSING CAPABLE OF FAITHFUL REPRODUCTION OF OBJECT COLOR FROM NEGATIVE FILM

CONTROLLER FOR INVERTER

MANUFACTURE OF COVERED MAGNET

CAMMA RAY MEASURING INSTRUMENT

POWER SUPPLY

FLUORESCENT LAMP INVERTER LIGHTING DEVICE

FLUORESCENT LAMP LIGHTING DEVICE

INTEGRATED SENSOR ARRAY

CHIP CARRIER

FORMATION OF BLIND THROUGH HOLE

FLEXIBLE AND RIGID PRINTED WIRING BOARD AND ITS MANUFACTURE